Title : 
Measuring flicker with discrete fourier transform
         
        
            Author : 
Espel, P. ; Poletaeff, A.
         
        
            Author_Institution : 
LNE, Paris
         
        
        
        
        
        
            Abstract : 
This paper describes a new standard for precision measurements of flicker. Two different methods are used and compared. The absolute standard uncertainty (1sigma) is estimated to be a few parts in 105.
         
        
            Keywords : 
discrete Fourier transforms; fluctuations; measurement standards; measurement uncertainty; power supply quality; discrete Fourier transform; flicker measurement; measurement standard; precision measurements; standard uncertainty; voltage fluctuation measurement; Amplitude modulation; Digital modulation; Discrete Fourier transforms; Displacement measurement; Electromagnetic compatibility; Electromagnetic measurements; Frequency modulation; Measurement standards; Sampling methods; Voltage;
         
        
        
        
            Conference_Titel : 
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
         
        
            Conference_Location : 
Broomfield, CO
         
        
            Print_ISBN : 
978-1-4244-2399-6
         
        
            Electronic_ISBN : 
978-1-4244-2400-9
         
        
        
            DOI : 
10.1109/CPEM.2008.4574733