Title :
Thermal and electrical effects of staggered micropin-fin dimensions for cooling of 3D microsystems
Author :
Sarvey, Thomas E. ; Yang Zhang ; Yue Zhang ; Hanju Oh ; Bakir, Muhannad S.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
Microfluidic cooling shows promise in cooling next generation 3D microsystems when integrated with through-silicon-vias. In this work, electrical and thermal effects of staggered micropin-fin heat sink dimensions are analyzed using deionized water. An experimental study of five different silicon micropin-fin arrays with a nominal height of 200 μm and diameters down to 30 μm was conducted at flow rates up to approximately 100mL/min and pressure drops up to approximately 200 kPa. The lowest convective thermal resistance achieved was 0.098 °C/W across a 1 cm2 die. These experimental results were then used to simulate temperature profiles of an interposer-cooled 3D stack.
Keywords :
convection; cooling; elemental semiconductors; heat sinks; integrated circuit design; microfabrication; microfluidics; micromechanical devices; silicon; thermal engineering; thermal resistance; three-dimensional integrated circuits; 3D microsystem; Si; convective thermal resistance; deionized water; electrical effect; interposer-cooled 3D stack; microfluidic cooling; silicon micropin-fin array; size 200 mum; staggered micropin-fin heat sink dimension; thermal effect; through-silicon-vias integration; Heat sinks; Microfluidics; Resistance heating; Thermal resistance; Three-dimensional displays; 3D IC; interposer; micro pin fin; microfluidic cooling;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2014 IEEE Intersociety Conference on
Conference_Location :
Orlando, FL
DOI :
10.1109/ITHERM.2014.6892283