Modeling field emission array tips using the MICHELLE gun code algorithm

Author

Petillo, John J. ; Panagos, Dimitrios N. ; Jensen, Kevin L.

Author_Institution

Leidos Corp., Billerica, MA, USA

fYear

2014

fDate

25-29 May 2014

Firstpage

1

Lastpage

1

Abstract

Summary form only given. We report on the incorporation of a model for field emitters (FE) in the MICHELLE Particle-In-Cell (PIC) beam optics code¹. The FE model is based on a Point Charge Model (PCM)² and allows for rapid and analytical representations of tip current, variation, and emission statistics. Its usage enables determining the impact of emission variation on current characteristics and emittance. Rather than cold field emission characterized by the Fowler Nordheim (FN) equation, a General Thermal-Field (GTF) emission model treats warm and hot field emission sources.

Keywords

field emission; field emitter arrays; particle beams; Fowler Nordheim equation; MICHELLE gun code algorithm; cold field emission; emission variation; field emission array tips; field emitters; general thermal-field emission model; hot field emission sources; particle-in-cell beam optics; point charge model; Algorithm design and analysis; Analytical models; Convergence; Iron; Mathematical model; Optical beams; Optics;

fLanguage

English

Publisher

ieee

Conference_Titel

Plasma Sciences (ICOPS) held with 2014 IEEE International Conference on High-Power Particle Beams (BEAMS), 2014 IEEE 41st International Conference on

Conference_Location

Washington, DC

Print_ISBN

978-1-4799-2711-1

Type

conf

DOI

10.1109/PLASMA.2014.7012535

Filename

7012535