• DocumentCode
    227784
  • Title

    On the importance of N4+ ions in the chemistry of a He-N microjet discharge

  • Author

    Eremin, Denis ; Hemke, Torben ; Brinkmann, Ralf Peter ; Mussenbrock, Thomas

  • Author_Institution
    Inst. of Theor. Electrotechnics, Ruhr-Univ. Bochum, Bochum, Germany
  • fYear
    2014
  • fDate
    25-29 May 2014
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given. The microdischarges under atmospheric pressure do not require expensive vacuum equipment and therefore are potentially advantageous for industrial and biological applications. The experimental diagnostics options are however rather limited due to the small size of the microdischarges and numerical modeling is thus very useful for understanding of the processes taking place there. One of the examples frequently treated in the literature is a He-N microjet discharge driven by an RF voltage source. Most of the treatments in the literature do not include the N4+ cluster ions in their chemistry sets. We demonstrate, by modeling a He-N microjet discharge with a hybrid code which treats electrons kinetically and ions using a fluid description, that N4+ ions tend to be the dominant ion species in such a discharge even for small fractions of He. We also discuss several additional interesting features of the discharge.
  • Keywords
    helium; high-frequency discharges; nitrogen; plasma applications; plasma chemistry; plasma diagnostics; plasma jets; plasma simulation; He-N; He-N microjet discharge; N4+; N4+ cluster ions; RF voltage source; atmospheric pressure; biological applications; chemistry sets; dominant ion species; experimental diagnostic options; fluid description; hybrid code; industrial applications; microdischarges; numerical modeling; pressure 1 atm; Atmospheric modeling; Biological information theory; Chemistry; Discharges (electric); Fault location; Ions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Sciences (ICOPS) held with 2014 IEEE International Conference on High-Power Particle Beams (BEAMS), 2014 IEEE 41st International Conference on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4799-2711-1
  • Type

    conf

  • DOI
    10.1109/PLASMA.2014.7012537
  • Filename
    7012537