Computer aided structural design of future MLCCs for high capacitance applications

We have tried to see the limit of capacitance density of MLCCs using a computer simulation technique. Dielectric properties of MLCCs with different particle size of BaTiO₃ were measured and the data were analyzed using B-SPLINE fitting to predict dielectric permittivity at arbitral temperature and AC-fields. The dielectric properties of barium titanate grains smaller then 100 nm were predicted using least squares fitting of the B-SPLINE coefficients. It was found from the simulation that the usage of barium titanate grains smaller than 80 nm did not give an advantage to increase the capacitance density as well as temperature stability of the MLCCs. The maximum capacitance was predicted for the 1608 (mm) chip size.