Title :
Reliability design of Multilayer Ceramic Capacitor against thinning of dielectric layers
Author :
Morita, Koichiro ; Mizuno, Youichi ; Kishi, Hiroshi
Author_Institution :
Taiyo Yuden Co. Ltd., Takasaki
Abstract :
The lifetime of multilayer ceramic capacitors (MLCCs) under a high dc electric field (200 kV/cm) was investigated. Mean time to failure (MTTF) during a highly accelerated lifetime test (HALT) was dependent on thickness of dielectric layers, despite the fixed electric field. Thermal stimulated current (TSC) and dielectric loss (tandelta) measurement revealed the amount of oxygen vacancies and their movement in MLCCs during the HALT. These results demanded "the localized oxygen vacancy model." Comparing the material designed for 1.0 mum dielectric layers to a conventional material, we proposed a promising material design for ultra-thin layer MLCCs with high reliability.
Keywords :
ceramic capacitors; dielectric losses; dielectric thin films; electric field effects; hole mobility; thermally stimulated currents; HALT; MLCC lifetime; MLCC reliability design; MTTF; TSC; dielectric layer thinning; dielectric loss; high dc electric field effects; highly accelerated lifetime test; localized oxygen vacancy model; mean time to failure; multilayer ceramic capacitor; oxygen vacancy mobility; thermal stimulated current; ultrathin layer MLCC material design; Capacitors; Ceramics; Current measurement; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Life estimation; Lifetime estimation; Nonhomogeneous media;
Conference_Titel :
Applications of Ferroelectrics, 2007. ISAF 2007. Sixteenth IEEE International Symposium on
Conference_Location :
Nara
Print_ISBN :
978-1-4244-1333-1
Electronic_ISBN :
1099-4734
DOI :
10.1109/ISAF.2007.4393326
