DocumentCode :
227803
Title :
Effects of moisture exposure on the mechanical behavior of polycarbonate materials used in electronic packaging
Author :
Chhanda, Nusrat J. ; Suhling, Jeffrey C. ; Canumalla, Sridhar
Author_Institution :
Center for Adv. Vehicle & Extreme Environ. Electron. (CAVE3), Auburn Univ., Auburn, AL, USA
fYear :
2014
fDate :
27-30 May 2014
Firstpage :
355
Lastpage :
364
Abstract :
The mechanical properties of polymer materials are often a key concern of the microelectronic packaging industry. The theoretical analysis of stress, strain, and deformation induced in electronic assemblies due to environmental exposures such as moisture adsorption, isothermal aging, and thermal cycling require the complete characterization of mechanical properties and constitutive behavior of the constituent materials. In this work, an experimental investigation has been performed on the effects of moisture adsorption on the stress-strain behavior of polycarbonate materials used in electronic packaging. Uniaxial test specimens were exposed in a controlled temperature and humidity chamber to combined hygrothermal exposures at 60 C and 90% RH, 60 C and 50% RH, and 40 C and 50% RH for various durations. After moisture preconditioning, a microscale tension-torsion testing machine was used to evaluate the complete stress-strain behavior of the material at several temperatures (T = 20 C, 40 C, and 60 C). It was found that moisture exposure strongly affected the mechanical properties of the tested polycarbonate, especially ultimate strain limit. Reversibility tests were also conducted to evaluate whether the degradations in the mechanical properties were recoverable. Upon fully redrying, the material was found to recover most of its original mechanical properties. In addition, optical microscopy was utilized to examine the fracture surfaces of the failed specimens, and observe the influence of moisture exposure.
Keywords :
adsorption; humidity; integrated circuit packaging; mechanical testing; moisture; optical microscopy; plastic deformation; plastic packaging; polymers; stress-strain relations; tensile testing; torsion; constituent materials; constitutive behavior; controlled temperature; deformation theoretical analysis; electronic assembly; electronics packaging; environmental exposures; failed specimens; fracture surfaces; humidity chamber; hygrothermal exposures; isothermal aging; mechanical behavior; mechanical properties; mechanical property degradations; microelectronic packaging industry; microscale tension-torsion testing machine; moisture adsorption; moisture exposure effects; moisture preconditioning; optical microscopy; polycarbonate materials; polymer materials; reversibility tests; strain limit; strain theoretical analysis; stress theoretical analysis; stress-strain behavior; temperature 20 C; temperature 40 C; temperature 60 C; tested polycarbonate; thermal cycling; uniaxial test specimens; Moisture; Polymers; Strain; Stress; Temperature; Testing; Humidity; Hygrothermal Exposure; Material Behavior; Moisture Adsorption; Polycarbonate; Reversibility; Stress-Strain Curve;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2014 IEEE Intersociety Conference on
Conference_Location :
Orlando, FL
ISSN :
1087-9870
Type :
conf
DOI :
10.1109/ITHERM.2014.6892302
Filename :
6892302
Link To Document :
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