Title :
Automation of 1 tΩ to 100 tΩ ultra-high resistance measurements at NIST
Author :
Jarrett, D.G. ; Muiz-Mercado, A.M. ; Kraft, M.E.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD
Abstract :
The automation of ultra-high resistance measurements at the National Institute of Standards and Technology (NIST) in the range 1 TOmega to 100 TOmega has been completed with the use of a programmable XY positioning system to facilitate the guarded connection of multiple standard resistors to an automated dual-source bridge. Automated guarded switching that is immune to leakages to ground is critical to the characterization of standard resistors and transfer standards in this range.
Keywords :
automation; electric resistance measurement; measurement standards; position control; automated dual-source bridge; automated guarded switching; automation; multiple standard resistors; programmable XY positioning system; resistance 1 Tohm to 100 Tohm; transfer standards; ultra-high resistance measurements; Automation; Bridge circuits; Capacitance; Coaxial components; Connectors; Electrical resistance measurement; Measurement standards; NIST; Position measurement; Resistors;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
DOI :
10.1109/CPEM.2008.4574757
