• DocumentCode
    2278201
  • Title

    Analysis of the switching process of power MOSFETs using a new analytical losses model

  • Author

    Rodríguez, Miguel ; Rodríguez, Alberto ; Miaja, Pablo F. ; Sebastián, Javier

  • Author_Institution
    Dept. de Ing. Electr., Univ. de Oviedo, Gijon, Spain
  • fYear
    2009
  • fDate
    20-24 Sept. 2009
  • Firstpage
    3790
  • Lastpage
    3797
  • Abstract
    The piecewise linear model has traditionally been used to calculate switching losses in switching mode power supplies due to its simplicity and good performance. However, the use of the latest low voltage power MOSFET generations and the continuously increasing range of switching frequencies has made it necessary to review this model to account for the parasitic inductances that it does not include. This paper presents a complete analytical switching loss model for power MOSFETs in low voltage switching converters that includes the most relevant parasitics. It clarifies the switching process, providing information about how these parasitics, especially inductances, determine switching losses and hence the final converter efficiency. The analysis presented in this paper yields two different types of possible switching situations: capacitance-limited switching and inductance-limited switching. This paper shows that, while the piecewise linear model may be applied in the former, the proposed model is more accurate for the latter. Carefully-obtained experimental results, described in detail, support the analytical results presented.
  • Keywords
    piecewise linear techniques; power MOSFET; power semiconductor switches; semiconductor device models; switching convertors; analytical losses model; capacitance-limited switching; converter efficiency; inductance-limited switching; parasitic inductance; piecewise linear model; power MOSFET; switching converters; switching losses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Congress and Exposition, 2009. ECCE 2009. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-2893-9
  • Electronic_ISBN
    978-1-4244-2893-9
  • Type

    conf

  • DOI
    10.1109/ECCE.2009.5316282
  • Filename
    5316282