DocumentCode :
2278328
Title :
Ductile-to-brittle transition strain rate
Author :
Darveaux, Robert ; Reichman, Corey
Author_Institution :
Amkor Technol. Inc., Chandler, AZ
fYear :
2006
fDate :
6-8 Dec. 2006
Firstpage :
283
Lastpage :
289
Abstract :
Solder joint failure mode depends on factors such as loading mode (shear vs. tensile), temperature, and strain rate. For any given loading mode and temperature, there is a transition from ductile failure to brittle failure as strain rate is increased. This ductile-to-brittle transition strain rate (DTBTSR) is one of the best indicators for robustness relative to impact loading. A higher value for DTBTSR is better. DTBTSR was measured for a wide range of lead free solder joints. The effects of pad metallization, solder alloy, reflow conditions, thermal aging, test temperature, and loading mode were characterized. DTBTSR was found to improve with 1) electroplated Ni/Au over other finishes (as long as the substrate supplier has a well controlled process), 2) less reflow time above liquidus for Cu pad metallization, 3) mild thermal aging, 4) higher test temperature, and 5) shear loading over tensile loading.
Keywords :
copper; failure analysis; gold; metallisation; nickel; reflow soldering; solders; strain ageing; tensile testing; Cu; Ni-Au; brittle failure; ductile failure; ductile-to-brittle transition; impact loading; lead free solder joints; loading mode; pad metallization; reflow conditions; solder alloy; solder joint failure mode; strain rate; test temperature; thermal aging; Aging; Capacitive sensors; Environmentally friendly manufacturing techniques; Metallization; Robustness; Soldering; Temperature; Tensile strain; Testing; Thermal loading;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 2006. EPTC '06. 8th
Conference_Location :
Singapore
Print_ISBN :
1-4244-0664-1
Electronic_ISBN :
1-4244-0665-X
Type :
conf
DOI :
10.1109/EPTC.2006.342730
Filename :
4147259
Link To Document :
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