Title :
Cyclic bend fatigue reliability investigation for Sn-Ag-Cu solder joints
Author :
Che, F.X. ; Pang, H.L.J. ; Zhu, W.H. ; Sun, Anthony Y S
Author_Institution :
Packaging Anal. & Design Center, United Test & Assembly Center Ltd., Singapore
Abstract :
In this study, VQFN assembly and FBGA assembly with Sn-3.8Ag-0.7Cu lead-free solder and OSP board surface finish were tested under four-point cyclic bending load at high temperature (125degC). Experimental results show that the FBGA component has higher bending fatigue resistance compared to VQFN component at the same bending condition. Failure mode analysis shows that the dominant failure is solder joint fatigue cracking failure for both assemblies. FEA modeling and simulation were performed to investigate the stress-strain behavior of solder joint. Energy-based bending fatigue model has been developed based on experimental data and FEA results for VQFN assembly under high temperature bending condition. Bend fatigue model proposed in this paper for VQFN assembly was compared to energy-based fatigue model derived from bulk solder fatigue test. Bending fatigue model from VQFN specimen results in significant difference in predicting bending fatigue for FBGA assembly compared to experimental result. However, the fatigue model from bulk solder fatigue test is suitable for prediction of FBGA bending fatigue life
Keywords :
ball grid arrays; copper alloys; failure analysis; fatigue cracks; fatigue testing; fine-pitch technology; finite element analysis; reliability; silver alloys; soldering; surface finishing; tin alloys; 125 C; FBGA assembly; FEA modeling; OSP board surface finish; SnAgCu; VQFN assembly; bending fatigue life; bulk solder fatigue test; cyclic bend fatigue reliability; energy-based bending fatigue; failure mode analysis; lead-free solder; solder joint fatigue cracking failure; solder joints; stress-strain behavior; Assembly; Environmentally friendly manufacturing techniques; Fatigue; Lead; Predictive models; Soldering; Surface cracks; Surface finishing; Temperature; Testing;
Conference_Titel :
Electronics Packaging Technology Conference, 2006. EPTC '06. 8th
Conference_Location :
Singapore
Print_ISBN :
1-4244-0664-1
Electronic_ISBN :
1-4244-0665-X
DOI :
10.1109/EPTC.2006.342735