DocumentCode
2278425
Title
Effects of backside grooving on leakage loss of conductor-backed coplanar waveguide
Author
Hotta, Masashi ; Kobayashi, Masahiro ; Inoue, Tomoyuki ; Hano, Mitsuo ; Sakane, Toshio
Author_Institution
Dept. of Electr. & Electron. Eng., Yamaguchi Univ., Ube, Japan
Volume
2
fYear
2001
fDate
3-6 Dec. 2001
Firstpage
847
Abstract
Leakage loss of grooving conductor backed coplanar waveguide (CBCPW) has been analysed by using the hybrid 2D-FDTD Method and the curve-fitting procedure. From numerical results, it has been confirmed that the leakage-loss of the CBCPW can be reduced over the wide range of operating frequency by constructing the groove on the backside of CBCPW substrate and also predicted the existence of the optimum grooving width. Furthermore, by investigating the relation between the leakage-loss of CBCPW and the position or the size of the backside groove in detail, we discussed what is dominantly affected on the leakage-loss reduction of grooving CBCPW.
Keywords
coplanar waveguides; curve fitting; finite difference time-domain analysis; losses; waveguide theory; backside grooving; conductor-backed coplanar waveguide; curve-fitting procedure; hybrid 2D-FDTD method; leakage loss; operating frequency; optimum grooving width; Conductors; Coplanar waveguides; Curve fitting; Frequency; Gallium arsenide; MMICs; Microwave devices; Microwave integrated circuits; Monolithic integrated circuits; Numerical simulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 2001. APMC 2001. 2001 Asia-Pacific
Conference_Location
Taipei, Taiwan
Print_ISBN
0-7803-7138-0
Type
conf
DOI
10.1109/APMC.2001.985502
Filename
985502
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