Title :
Proceedings 13th IEEE VLSI Test Symposium
fDate :
April 30 1995-May 3 1995
Abstract :
The following topics were dealt with: advanced test pattern generation methods; mixed-signal circuit test; defect coverage and test quality; advanced BIST approaches; synthesis for testability; fault modeling; fault simulation; fault diagnosis; design for testability; IDDQ testing; automatic test pattern generation; delay fault testing; self-checking systems
Keywords :
VLSI; automatic testing; built-in self test; design for testability; fault diagnosis; integrated circuit testing; logic testing; BIST; IDDQ testing; VLSI test; automatic test pattern generation; defect coverage; delay fault testing; design for testability; fault diagnosis; fault modeling; fault simulation; mixed-signal circuit test; self-checking systems; synthesis for testability; test pattern generation methods; test quality;
Conference_Titel :
VLSI Test Symposium, 1995. Proceedings., 13th IEEE
Conference_Location :
Princeton, NJ, USA
Print_ISBN :
0-8186-7000-2
DOI :
10.1109/VTEST.1995.512609
