• DocumentCode
    2278640
  • Title

    Ferroelectric and Piezoelectric Properties of Pb-free Based (Bio5Nao. 5) TijxDxO3 (D = Nb5+, W6+) Ceramics

  • Author

    Yeo, Hong-Goo ; Sung, Yeon-Soo ; Song, Tae-Kwon ; Cho, Jong-Ho ; Jeong, Soon-Jong ; Song, Jae-sung ; Kim, Myong-Ho

  • Author_Institution
    Changwon Nat. Univ., Changwon
  • fYear
    2007
  • fDate
    27-31 May 2007
  • Firstpage
    673
  • Lastpage
    676
  • Abstract
    In an effort for better understanding on (Bi0.5Na0.5)TiO3, donors such as Nb5+ and W6+ were doped by a conventional solid state mixing process. Their doping effects on ferroelectric and piezoelectric properties of (Bi0.5Na0.5)Ti1-xDxO3 were investigated. The solubility limit of Nb (xles0.01) and W (xles0.008) was determined by the X-ray diffraction after a typical sintering at 1150degC for 2 hours in air. Microstructurally grain size decreased with doping within each solubility limit. As for ferroelectric and piezoelectric properties, coercive fields (Ec) and mechanical quality factors (Qm) decreased with doping while piezoelectric constant (d33) increased, which is a similar tendency observed in the typical donor doped Pb(Zr,Ti)O3 ceramics.
  • Keywords
    X-ray diffraction; bismuth compounds; dielectric hysteresis; doping profiles; ferroelectric ceramics; ferroelectricity; grain size; piezoceramics; piezoelectricity; sintering; sodium compounds; solubility; titanium compounds; Bi0.5Na0.5TiNBO3; Bi0.5Na0.5TiWO3; X-ray diffraction; ceramics; coercive fields; doping effects; ferroelectric properties; hysteresis loop; mechanical quality factors; microstructural grain size; piezoelectric properties; sintering; solid state mixing process; solubility; temperature 1150 C; time 2 hour; Bismuth; Ceramics; Doping; Ferroelectric materials; Grain size; Mechanical factors; Niobium; Q factor; Solid state circuits; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2007. ISAF 2007. Sixteenth IEEE International Symposium on
  • Conference_Location
    Nara
  • ISSN
    1099-4734
  • Print_ISBN
    978-1-4244-1334-8
  • Electronic_ISBN
    1099-4734
  • Type

    conf

  • DOI
    10.1109/ISAF.2007.4393367
  • Filename
    4393367