DocumentCode
2278647
Title
Application of FEM simulation technology on thermal design of electronic packaging device
Author
Fang, Song Fang ; Ping, Lai ; Xian-long, Feng ; Xiao-qi, He
Author_Institution
Nat. Key Lab. of Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component, Guangzhou, China
fYear
2010
fDate
16-19 Aug. 2010
Firstpage
977
Lastpage
979
Abstract
Thermal design is necessarily to be considered for high-power electronic packaging device design. In this paper, the thermal characteristic of packaging device was studied using FEM, for example, phase shifter and LED. The model for thermal condition of phase shifter was established. The top junction temperature obtained by simulation shows tendency as tested experiment results, verifying the correctness of the simulation model and method used. The relation of relative temperature rising to different solder voids, substrate thickness and material is studied by simution. The quantitative relations of these parameters and temperature provided a theoretical basis for the thermal design, the optimization of parameters and the reliability improvement of phase shifter and LED.
Keywords
circuit optimisation; finite element analysis; integrated circuit reliability; light emitting diodes; phase shifters; solders; thermal management (packaging); FEM simulation technology; LED; high-power electronic packaging device; optimization; phase shifter; reliability; solder voids; substrate thickness; thermal design; Electronic packaging thermal management; Finite element methods; Junctions; Light emitting diodes; Phase shifters; Temperature distribution; Thermal analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4244-8140-8
Type
conf
DOI
10.1109/ICEPT.2010.5582635
Filename
5582635
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