Title :
Validation of inductance measurements at NMi VSL
Author :
Dierikx, E.F. ; van der Beek, J.H.N.
Author_Institution :
NMi Van Swinden Lab., Delft, Netherlands
Abstract :
To validate an inductance resonance bridge, which is based on a commercial capacitance bridge, a second resonance bridge was built, based on a self-composed 4 terminal-pair impedance ratio bridge. From analysis of the results on 100 mH standards at 1 kHz, discrepancies have been resolved and the uncertainty has been improved to 26 muH/H.
Keywords :
bridge instruments; inductance measurement; measurement uncertainty; frequency 1 kHz; inductance measurements; inductance resonance bridge; self- composed 4 terminal-pair impedance ratio bridge; standards; uncertainty; Bridge circuits; Capacitance; Capacitors; Equations; Impedance; Inductance measurement; Inductors; RLC circuits; Resistors; Resonance;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
DOI :
10.1109/CPEM.2008.4574791
