• DocumentCode
    2278692
  • Title

    Verification of transient response of linear analog circuits

  • Author

    Balivada, Ashok ; Hoskote, Yatin ; Abraham, Jacob A.

  • Author_Institution
    Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
  • fYear
    1995
  • fDate
    30 Apr-3 May 1995
  • Firstpage
    42
  • Lastpage
    47
  • Abstract
    With the introduction of complex analog designs the need to verify the circuit behavior completely and efficiently cannot be overemphasized. Recognizing the limitation of circuit simulation to achieve this goal, we present a novel approach based on formal techniques developed for digital circuits. Given a transfer function (specification) and its implementation using operational amplifier macro circuits, we verify the correctness of the transient behavior of the implementation over all possible input waveforms. Transforming the specification and the extracted state equations of the implementation from the s-domain to the Z-domain facilitates a digital representation in terms of adders, multipliers and delay elements. These two digitized circuits are then compared using techniques for checking compatibility of states in finite state machines. An example that illustrates the technique is presented
  • Keywords
    active networks; analogue circuits; equivalent circuits; frequency-domain analysis; linear network analysis; operational amplifiers; state-space methods; transfer functions; transient analysis; transient response; Z-domain; circuit behavior; digital representation; extracted state equations; finite state machines; formal techniques; input waveforms; linear analog circuits; operational amplifier macro circuits; transfer function; transient response; Added delay; Adders; Analog circuits; Automata; Circuit simulation; Digital circuits; Equations; Operational amplifiers; Transfer functions; Transient response;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1995. Proceedings., 13th IEEE
  • Conference_Location
    Princeton, NJ
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-7000-2
  • Type

    conf

  • DOI
    10.1109/VTEST.1995.512615
  • Filename
    512615