DocumentCode :
2278692
Title :
Verification of transient response of linear analog circuits
Author :
Balivada, Ashok ; Hoskote, Yatin ; Abraham, Jacob A.
Author_Institution :
Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
fYear :
1995
fDate :
30 Apr-3 May 1995
Firstpage :
42
Lastpage :
47
Abstract :
With the introduction of complex analog designs the need to verify the circuit behavior completely and efficiently cannot be overemphasized. Recognizing the limitation of circuit simulation to achieve this goal, we present a novel approach based on formal techniques developed for digital circuits. Given a transfer function (specification) and its implementation using operational amplifier macro circuits, we verify the correctness of the transient behavior of the implementation over all possible input waveforms. Transforming the specification and the extracted state equations of the implementation from the s-domain to the Z-domain facilitates a digital representation in terms of adders, multipliers and delay elements. These two digitized circuits are then compared using techniques for checking compatibility of states in finite state machines. An example that illustrates the technique is presented
Keywords :
active networks; analogue circuits; equivalent circuits; frequency-domain analysis; linear network analysis; operational amplifiers; state-space methods; transfer functions; transient analysis; transient response; Z-domain; circuit behavior; digital representation; extracted state equations; finite state machines; formal techniques; input waveforms; linear analog circuits; operational amplifier macro circuits; transfer function; transient response; Added delay; Adders; Analog circuits; Automata; Circuit simulation; Digital circuits; Equations; Operational amplifiers; Transfer functions; Transient response;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1995. Proceedings., 13th IEEE
Conference_Location :
Princeton, NJ
ISSN :
1093-0167
Print_ISBN :
0-8186-7000-2
Type :
conf
DOI :
10.1109/VTEST.1995.512615
Filename :
512615
Link To Document :
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