DocumentCode
2278695
Title
Reliability of indium solder die bonding of high power cm-bars
Author
Guoguang, Lu ; Yun, Huang ; Yunfei, En
Author_Institution
Nat. Key Lab. of Sci. & Technol. on Reliability Phys., CEPREI, Guangzhou, China
fYear
2010
fDate
16-19 Aug. 2010
Firstpage
968
Lastpage
972
Abstract
High power semiconductor lasers have found increased applications. Indium solder is one of the most widely used solders in high power laser die bonding, its´ reliability is rated as the key parameter deciding about the more or less extensive use of indiun solder die bonding of high power diode arrays. In this paper, 20 samples were tested under two conditions, three degradation modes were observed during the lifetime test, the failure analysis results showed that the stress and defects induced during the indium solder bonding process play a key role in the degradation behavior of the bars.
Keywords
failure analysis; indium; integrated circuit reliability; microassembling; semiconductor laser arrays; solders; In; failure analysis; high power cm-bars; high power diode arrays; high power laser die bonding; high power semiconductor lasers; indium solder die bonding; reliability; Degradation; Heating; Indium; Lifetime estimation; Reliability; Semiconductor laser arrays;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4244-8140-8
Type
conf
DOI
10.1109/ICEPT.2010.5582638
Filename
5582638
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