DocumentCode
2278701
Title
A solution for the on-line test of analog ladder filters
Author
Vazquez, David ; Rueda, A. ; Huertas, J.L.
Author_Institution
Dpto. de Diseno Analogico, Univ. de Sevilla, Spain
fYear
1995
fDate
30 Apr-3 May 1995
Firstpage
48
Lastpage
53
Abstract
In this paper we study stability problems associated with the previously developed design for test (DFT) methodology applied to ladder filters. A solution based on simple modification of the basic DFT strategy is proposed which allows on-line testing of ladder filters. A filter example demonstrates the feasibility of the solution
Keywords
active filters; analogue integrated circuits; circuit stability; design for testability; integrated circuit testing; ladder filters; active filters; analog ladder filters; analogue ICs; design for test methodology; on-line testing; solution feasibility; stability problems; Analog circuits; Circuit testing; Control systems; Design for testability; Digital filters; Feedback loop; Signal generators; Signal processing; Stability; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1995. Proceedings., 13th IEEE
Conference_Location
Princeton, NJ
ISSN
1093-0167
Print_ISBN
0-8186-7000-2
Type
conf
DOI
10.1109/VTEST.1995.512616
Filename
512616
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