Title :
Self-test in a VCM driver chip
Author :
Sebaa, Lahouari ; Gardner, Norm ; Neidorff, Robert ; Valley, Rich
Author_Institution :
Western Digital Corp., Irvine, CA, USA
fDate :
30 Apr-3 May 1995
Abstract :
This paper describes a cost effective self-test mode in a complex mixed-signal device. The device under test (DUT) is a Voice-Coil Motor (VCM) H-bridge amplifier with an onchip 11-bit D/A converter. The self-test mode can be initiated at the chip, board and system levels of testing and troubleshooting. The added self-test circuitry does not induce any noticeable silicon overhead
Keywords :
bridge circuits; built-in self test; design for testability; digital-analogue conversion; driver circuits; instrumentation amplifiers; integrated circuit testing; mixed analogue-digital integrated circuits; pulse amplifiers; 11 bit; H-bridge amplifier; VCM driver chip; complex mixed-signal device; device under test; onchip D/A converter; self-test circuitry; self-test mode; voice-coil motor; Automatic testing; Built-in self-test; Circuit testing; Costs; Design for testability; Driver circuits; Instruments; Pins; System testing; Voltage;
Conference_Titel :
VLSI Test Symposium, 1995. Proceedings., 13th IEEE
Conference_Location :
Princeton, NJ
Print_ISBN :
0-8186-7000-2
DOI :
10.1109/VTEST.1995.512619
