DocumentCode
227876
Title
Phonon thermal conduction in periodically porous silicon nanobeams
Author
Woosung Park ; Marconnet, Amy M. ; Kodama, Tomoya ; Joonsuk Park ; Sinclair, Robert ; Asheghi, Mehdi ; Goodson, Kenneth E.
Author_Institution
Dept. of Mech. Eng., Stanford Univ., Stanford, CA, USA
fYear
2014
fDate
27-30 May 2014
Firstpage
637
Lastpage
640
Abstract
The thermal conductivity of single crystal silicon can be reduced by the introduction of boundaries at the nanoscale. We present the measured thermal conductivity of single crystal silicon nanobeams patterned with a single row of holes at room temperature: the hole diameter and the spacing vary from 100nm to 250nm and from 200 nm to 800nm, respectively. A steady-state four-probe joule heating measurement technique is used to extract the thermal conductivity of the porous silicon nanobeams across a range of pore geometries. The reduction in thermal conductivity owing to the hole boundaries is up to a factor of two.
Keywords
elemental semiconductors; nanostructured materials; phononic crystals; porous semiconductors; silicon; thermal conductivity; four-probe joule heating measurement; hole boundaries; periodically porous silicon nanobeams; phonon thermal conduction; single crystal silicon nanobeams; size 100 nm to 800 nm; temperature 293 K to 298 K; thermal conductivity; Conductivity; Metals; Phonons; Resistance; Silicon; Temperature measurement; Thermal conductivity; Holey Silicon; Phononic Crystal; Porous Silicon; Silicon Porous Nanobeam; Thermal Conductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2014 IEEE Intersociety Conference on
Conference_Location
Orlando, FL
ISSN
1087-9870
Type
conf
DOI
10.1109/ITHERM.2014.6892341
Filename
6892341
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