DocumentCode
2278812
Title
Nanoindentation characteristics of Cu6 Sn5 formed in lead free solder joints
Author
Zhang, Zhihao ; Kim, Jongmyung ; Li, Mingyu
Author_Institution
State Key Lab. of Adv. Welding Production Technol., Harbin Inst. of Technol., Shenzhen, China
fYear
2010
fDate
16-19 Aug. 2010
Firstpage
953
Lastpage
956
Abstract
A new structural effect that was developed based on the concepts of the cantilever beams has been proposed in order to illustrate the measurement divergence of nanoindentation test for Cu6Sn5 IMCs. Cu6Sn5 IMCs were fabricated in Sn3.5Ag/Cu solder joints by wetting reaction at 250°C and subsequent thermal aging, and measured by nanoindentation. In this study, the extra displacement created by the cantilever-like beam structural effect were investigated and discussed through the experimental initial and boundary conditions of Cu6Sn5 IMCs. The results showed that the variations of the loading procedures, sample shape, indent positions and indent directions would change the strain gradients on the matrixes, and thus cause the extra displacement. Moreover, through the study of the two-dimensional finite element analysis, the data divergence is minor in the top-view direction. In light of the results obtained from this study, we believe that structural effect would influence measurement accuracy for nanoindentation and test in the top-view direction would have great potential for future applications.
Keywords
copper alloys; finite element analysis; nanoindentation; solders; thermal management (packaging); wetting; Cu6Sn5; SnAg-Cu; cantilever beam structural effect; cantilever-like beam structural effect; finite element analysis; lead free solder joints; measurement divergence; nanoindentation characteristic; nanoindentation test; strain gradient; temperature 250 C; thermal aging; wetting reaction; Aging; Copper; Loading; Soldering; Strain; Structural beams; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4244-8140-8
Type
conf
DOI
10.1109/ICEPT.2010.5582644
Filename
5582644
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