DocumentCode :
2278818
Title :
A new short-bar method for 4TP admittance standards calibration by using modified Z-matrix expression to improve S/N for higher impedance
Author :
Suzuki, K.
Author_Institution :
Meas. Stand. Center, Agilent Technol. Int. Japan, Ltd., Hachioji, Japan
fYear :
2008
fDate :
8-13 June 2008
Firstpage :
350
Lastpage :
351
Abstract :
This paper describes how to calibrate four-terminal-pair (4TP) admittance standards using a new short-bar method with modified Z-matrix expression containing a correction term. The short-bar method is to measure the signal to correspond to the standard with better S/N for higher impedance standard, especially 1 pF. Therefore a 1 pF capacitor can be calibrated containing the direct measurement at reporting frequencies. As this method does not require the equivalent circuit, it can be applied to general 4TP admittance calibration.
Keywords :
calibration; electric admittance measurement; measurement standards; calibration; capacitance 1 pF; capacitor; four-terminal-pair admittance standards; impedance; modified Z-matrix expression; short-bar method; Admittance measurement; Calibration; Capacitance; Capacitors; Equivalent circuits; Frequency measurement; Impedance measurement; Interpolation; Measurement standards; Noise measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
Type :
conf
DOI :
10.1109/CPEM.2008.4574797
Filename :
4574797
Link To Document :
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