• DocumentCode
    2278818
  • Title

    A new short-bar method for 4TP admittance standards calibration by using modified Z-matrix expression to improve S/N for higher impedance

  • Author

    Suzuki, K.

  • Author_Institution
    Meas. Stand. Center, Agilent Technol. Int. Japan, Ltd., Hachioji, Japan
  • fYear
    2008
  • fDate
    8-13 June 2008
  • Firstpage
    350
  • Lastpage
    351
  • Abstract
    This paper describes how to calibrate four-terminal-pair (4TP) admittance standards using a new short-bar method with modified Z-matrix expression containing a correction term. The short-bar method is to measure the signal to correspond to the standard with better S/N for higher impedance standard, especially 1 pF. Therefore a 1 pF capacitor can be calibrated containing the direct measurement at reporting frequencies. As this method does not require the equivalent circuit, it can be applied to general 4TP admittance calibration.
  • Keywords
    calibration; electric admittance measurement; measurement standards; calibration; capacitance 1 pF; capacitor; four-terminal-pair admittance standards; impedance; modified Z-matrix expression; short-bar method; Admittance measurement; Calibration; Capacitance; Capacitors; Equivalent circuits; Frequency measurement; Impedance measurement; Interpolation; Measurement standards; Noise measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
  • Conference_Location
    Broomfield, CO
  • Print_ISBN
    978-1-4244-2399-6
  • Electronic_ISBN
    978-1-4244-2400-9
  • Type

    conf

  • DOI
    10.1109/CPEM.2008.4574797
  • Filename
    4574797