DocumentCode
2278818
Title
A new short-bar method for 4TP admittance standards calibration by using modified Z-matrix expression to improve S/N for higher impedance
Author
Suzuki, K.
Author_Institution
Meas. Stand. Center, Agilent Technol. Int. Japan, Ltd., Hachioji, Japan
fYear
2008
fDate
8-13 June 2008
Firstpage
350
Lastpage
351
Abstract
This paper describes how to calibrate four-terminal-pair (4TP) admittance standards using a new short-bar method with modified Z-matrix expression containing a correction term. The short-bar method is to measure the signal to correspond to the standard with better S/N for higher impedance standard, especially 1 pF. Therefore a 1 pF capacitor can be calibrated containing the direct measurement at reporting frequencies. As this method does not require the equivalent circuit, it can be applied to general 4TP admittance calibration.
Keywords
calibration; electric admittance measurement; measurement standards; calibration; capacitance 1 pF; capacitor; four-terminal-pair admittance standards; impedance; modified Z-matrix expression; short-bar method; Admittance measurement; Calibration; Capacitance; Capacitors; Equivalent circuits; Frequency measurement; Impedance measurement; Interpolation; Measurement standards; Noise measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location
Broomfield, CO
Print_ISBN
978-1-4244-2399-6
Electronic_ISBN
978-1-4244-2400-9
Type
conf
DOI
10.1109/CPEM.2008.4574797
Filename
4574797
Link To Document