DocumentCode
227882
Title
Micro-fluidic silicon cooling devices for particle tracking detectors
Author
Romagnoli, G. ; Buytaert, J. ; Dumps, R. ; Francescon, Antonio ; De Aguiar Francisco, O.A. ; Howell, Keith ; Mapelli, A. ; Nuessle, G. ; Petagna, P.
Author_Institution
Phys. Dept., CERN Eur. Lab. for Particle Phys., Geneva, Switzerland
fYear
2014
fDate
27-30 May 2014
Firstpage
658
Lastpage
665
Abstract
In the last years the Detector Technology group (PH-DT) [1] of the CERN Physics Department in Geneva, Switzerland, has started the study of novel micro-fluidic cooling systems obtained through standard micro-fabrication processes that outperform traditional cooling approaches for the thermal management of silicon particle detectors. The fabrication of the cooling devices starts with the etching of the microchannels in a silicon wafer; the channels are then closed with another silicon wafer through a direct bonding process. The devices are then interfaced to the front-end electronics of the detector via a thin adhesive layer. Silicon cooling devices with thickness of the order of few hundred microns guarantee the desired minimization of material in front of the tracking sensors and eliminate mechanical stresses due to the mismatch of Coefficient of Thermal Expansion (CTE) between the sensor and its related electronics. Combining the versatility of standard micro-fabrication processes with the high thermal efficiency typical of micro-fluidics, it is possible to produce effective thermal management devices that are well adapted to very different detector configurations.
Keywords
cooling; etching; microfabrication; microfluidics; silicon; silicon radiation detectors; thermal expansion; thermal management (packaging); thin film devices; wafer bonding; CTE; Si; coefficient of thermal expansion; cooling approach; direct bonding process; frontend electronics; material minimization; microchannel etching; microfluidic silicon cooling device; silicon particle tracking detector; silicon wafer; standard microfabrication process; thermal efficiency; thermal management device; thin adhesive layer; tracking sensor; Connectors; Cooling; Detectors; Heating; Silicon; Temperature sensors; Cooling; Front-End Electronics; High-Energy Physics; Micro-fabrication; Micro-fluidics; Particle Detectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2014 IEEE Intersociety Conference on
Conference_Location
Orlando, FL
ISSN
1087-9870
Type
conf
DOI
10.1109/ITHERM.2014.6892344
Filename
6892344
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