• DocumentCode
    2278839
  • Title

    A new gate current model accounting for a non-Maxwellian electron energy distribution function

  • Author

    Gehring, A. ; Grasser, T. ; Kosina, H. ; Selberherr, S.

  • Author_Institution
    Inst. fur Microelectron., Technische Univ. Wien, Austria
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    235
  • Lastpage
    238
  • Abstract
    We report on a new formulation to describe hot electron injection through gate dielectrics. It is based on an expression which accounts for the non-Maxwellian shape of the electron energy distribution function. We use the first three even moments of the Boltzmann equation n, Tn, and βn found by the solution of a six moments transport model to describe the shape of the distribution function. Excellent agreement with results from rigorous Monte Carlo simulations and measurements is achieved.
  • Keywords
    Boltzmann equation; hot carriers; semiconductor device models; Boltzmann equation; gate current model; hot electron injection; non-Maxwellian electron energy distribution function; Distribution functions; Lattices; MOSFET circuits; Microelectronics; Monte Carlo methods; Secondary generated hot electron injection; Shape; Tail; Temperature distribution; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices, 2002. SISPAD 2002. International Conference on
  • Print_ISBN
    4-89114-027-5
  • Type

    conf

  • DOI
    10.1109/SISPAD.2002.1034560
  • Filename
    1034560