DocumentCode
2278839
Title
A new gate current model accounting for a non-Maxwellian electron energy distribution function
Author
Gehring, A. ; Grasser, T. ; Kosina, H. ; Selberherr, S.
Author_Institution
Inst. fur Microelectron., Technische Univ. Wien, Austria
fYear
2002
fDate
2002
Firstpage
235
Lastpage
238
Abstract
We report on a new formulation to describe hot electron injection through gate dielectrics. It is based on an expression which accounts for the non-Maxwellian shape of the electron energy distribution function. We use the first three even moments of the Boltzmann equation n, Tn, and βn found by the solution of a six moments transport model to describe the shape of the distribution function. Excellent agreement with results from rigorous Monte Carlo simulations and measurements is achieved.
Keywords
Boltzmann equation; hot carriers; semiconductor device models; Boltzmann equation; gate current model; hot electron injection; non-Maxwellian electron energy distribution function; Distribution functions; Lattices; MOSFET circuits; Microelectronics; Monte Carlo methods; Secondary generated hot electron injection; Shape; Tail; Temperature distribution; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation of Semiconductor Processes and Devices, 2002. SISPAD 2002. International Conference on
Print_ISBN
4-89114-027-5
Type
conf
DOI
10.1109/SISPAD.2002.1034560
Filename
1034560
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