Title :
Experimental and theoretical characterization of the plasma in an ECR reactor
Author :
Lampe, M. ; Douglass, S.R. ; Eddy, C.R., Jr. ; Joyce, G. ; Manheimer, W. ; Slinker, S.P. ; Weber, B.V.
Author_Institution :
Naval Res. Lab., Washington, DC, USA
Abstract :
Summary form only given. We have measured the spatial distribution of electron temperature and density, and plasma potential, in a two-magnet ECR reactor that is being used for etching. We report here on characterization of an Ar plasma. Work on Ar/Cl mixtures is beginning at the present time. The principal electron diagnostics at present are Langmuir probes, and a 140 GHz microwave interferometer. A variety of optical diagnostics, including VUV and optical emission spectroscopies, are being employed. The control parameters scanned cover the range of pressure 0.5 to 5 mT, flow rate 2.5 to 30 sccm, microwave input power 100 to 700 W, and a variety of magnetic field profiles. The location and bias of the etching stage has also been varied. We have developed a fast-running quasineutral PIC simulation code (particle ions, particle electrons), which represents the sheaths by means of appropriate potential jump and Bohm flow boundary conditions, and provides spatially resolved plasma densities, temperatures and distribution functions within the bulk plasma. Simulation results and analytic theory will be compared with the experimental results.
Keywords :
Langmuir probes; argon; electron density; plasma density; plasma devices; plasma diagnostics; plasma radiofrequency heating; plasma simulation; plasma temperature; sputter etching; 0.5 to 5 mtorr; 100 to 700 W; 140 GHz; Ar; Ar plasma; Bohm flow boundary conditions; ECR reactor; Langmuir probes; VUV emission spectroscopies; electron density; electron diagnostics; electron temperature; etching; microwave interferometer; optical diagnostics; optical emission spectroscopies; plasma densities; plasma potential; potential jump; quasineutral PIC simulation code; spatial distribution; two-magnet ECR reactor; Argon; Electrons; Etching; Optical interferometry; Plasma applications; Plasma density; Plasma diagnostics; Plasma measurements; Plasma temperature; Temperature distribution;
Conference_Titel :
Plasma Science, 1995. IEEE Conference Record - Abstracts., 1995 IEEE International Conference on
Conference_Location :
Madison, WI, USA
Print_ISBN :
0-7803-2669-5
DOI :
10.1109/PLASMA.1995.531632