• DocumentCode
    2278930
  • Title

    An optimized testable architecture for finite state machines

  • Author

    Kuo, Ting-Yu ; Liu, Chun-Yeh ; Saluja, Kewal K.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
  • fYear
    1995
  • fDate
    30 Apr-3 May 1995
  • Firstpage
    164
  • Lastpage
    169
  • Abstract
    This paper presents a testable architecture for FSM synthesis. The transfer, synchronizing and distinguishing sequences are obtained simultaneously by adding extra edges, if necessary, and their associated inputs and outputs to the original FSM. The algorithm that achieves this minimizes the number of extra edges that make a machine testable. The testable machine has the following properties: (1) transfer sequences of length at most [log2n] where n is the number of the states in the machine, to carry the machine from state Si to state S j for all i and j, (2) a synchronizing sequence of length at most [log2n] which sets the machine to a specific state S1, and (3) a distinguishing sequence of length at most [log2n]. The states can be observed at the output. Several synthesis benchmark circuits were investigated for area by using the architecture
  • Keywords
    circuit optimisation; finite state machines; logic CAD; logic testing; sequences; sequential circuits; FSM synthesis; distinguishing sequences; finite state machines; optimized testable architecture; synchronizing sequence; synthesis benchmark circuits; testable machine; transfer sequences; Automata; Benchmark testing; Circuit synthesis; Circuit testing; Clocks; Encoding; Hardware; Logic testing; Sequential analysis; Synchronization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1995. Proceedings., 13th IEEE
  • Conference_Location
    Princeton, NJ
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-7000-2
  • Type

    conf

  • DOI
    10.1109/VTEST.1995.512632
  • Filename
    512632