DocumentCode
2278930
Title
An optimized testable architecture for finite state machines
Author
Kuo, Ting-Yu ; Liu, Chun-Yeh ; Saluja, Kewal K.
Author_Institution
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
fYear
1995
fDate
30 Apr-3 May 1995
Firstpage
164
Lastpage
169
Abstract
This paper presents a testable architecture for FSM synthesis. The transfer, synchronizing and distinguishing sequences are obtained simultaneously by adding extra edges, if necessary, and their associated inputs and outputs to the original FSM. The algorithm that achieves this minimizes the number of extra edges that make a machine testable. The testable machine has the following properties: (1) transfer sequences of length at most [log2n] where n is the number of the states in the machine, to carry the machine from state Si to state S j for all i and j, (2) a synchronizing sequence of length at most [log2n] which sets the machine to a specific state S1, and (3) a distinguishing sequence of length at most [log2n]. The states can be observed at the output. Several synthesis benchmark circuits were investigated for area by using the architecture
Keywords
circuit optimisation; finite state machines; logic CAD; logic testing; sequences; sequential circuits; FSM synthesis; distinguishing sequences; finite state machines; optimized testable architecture; synchronizing sequence; synthesis benchmark circuits; testable machine; transfer sequences; Automata; Benchmark testing; Circuit synthesis; Circuit testing; Clocks; Encoding; Hardware; Logic testing; Sequential analysis; Synchronization;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1995. Proceedings., 13th IEEE
Conference_Location
Princeton, NJ
ISSN
1093-0167
Print_ISBN
0-8186-7000-2
Type
conf
DOI
10.1109/VTEST.1995.512632
Filename
512632
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