Title :
A direct comparison of Josephson Array Voltage Standards
Author :
Liu, L.X. ; Chua, S.W. ; Lee, J. ; Zhou, Y. ; Hamilton, C.A.
Author_Institution :
Nat. Metrol. Centre, A*STAR, Singapore, Singapore
Abstract :
A number of direct comparisons of Josephson Array Voltage Standards (JAVS) using Superconductor-Insulator-Superconductor (SIS) junction arrays have been performed at the National Metrology Centre (NMC), Singapore. The comparisons were performed over a range of voltage from 1 V to 10 V and with different combinations of array chips, both USA and German made. The comparisons used a parallel biasing method that made it relatively easy to quickly bias both arrays on a nearly matched quantum step. The Type-A uncertainty of the difference voltage was typically lower than 1.5 nV.
Keywords :
measurement standards; measurement uncertainty; superconductor-insulator-superconductor devices; voltage measurement; Josephson array voltage standards; SIS junction arrays; array chips; difference voltage; parallel biasing method; superconductor-insulator-superconductor junction arrays; type-A uncertainty; Instruments; Interference; Measurement standards; Metrology; Microwave antenna arrays; Microwave frequencies; Switches; Transformers; Uncertainty; Voltage measurement;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
DOI :
10.1109/CPEM.2008.4574806