DocumentCode :
2278990
Title :
Simulation of direct source-to-drain tunnelling using the density gradient formalism: Non-Equilibrium Greens Function calibration
Author :
Watling, J.R. ; Brown, A.R. ; Asenov, A. ; Svizhenko, A. ; Anantram, M.P.
Author_Institution :
Dept. of Electron. & Electr. Eng., Glasgow Univ., UK
fYear :
2002
fDate :
2002
Firstpage :
267
Lastpage :
270
Abstract :
Quantum mechanical confinement effects, gate, hand-to-hand and source-to-drain tunnelling will dramatically affect the characteristics of future generation nanometre scaled devices. It has been demonstrated already that first-order quantum corrections, which satisfactorily describe quantum confinement effects, can be introduced into efficient TCAD orientated drift-diffusion simulators using the density gradient approach. In this paper we refer to Non-Equilibrium Green´s Function simulations in order to calibrate the density gradient formalism in respect of both confinement and source-to-drain tunnelling using different effective masses in directions normal and parallel to the conducting channel. We demonstrate that the density gradient formalism can describe accurately the current characteristics in sub 20 nm double gate MOSFETs.
Keywords :
Green´s function methods; MOSFET; effective mass; nanotechnology; semiconductor device models; tunnelling; density gradient formalism; direct source-drain tunnelling; double gate MOSFETs; effective masses; first-order quantum corrections; nano-scale devices; nonequilibrium Greens function calibration; quantum confinement; Calibration; Character generation; Effective mass; Green function; Green´s function methods; MOSFETs; Nanoscale devices; Potential well; Quantum mechanics; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation of Semiconductor Processes and Devices, 2002. SISPAD 2002. International Conference on
Print_ISBN :
4-89114-027-5
Type :
conf
DOI :
10.1109/SISPAD.2002.1034569
Filename :
1034569
Link To Document :
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