• DocumentCode
    2279038
  • Title

    Accurate Formula for Quality Factor Q of Thin Film Bulk Acoustic Resonators with Close Series and Parallel Resonance Frequencies

  • Author

    Chen, Pei-Yen ; Chin, Yung-Chung ; Chen, Chi-Yun ; Hou, Chun-Li

  • Author_Institution
    Chung-Shan Inst. of Sci. & Technol., Taoyuan
  • fYear
    2007
  • fDate
    27-31 May 2007
  • Firstpage
    757
  • Lastpage
    759
  • Abstract
    This paper presents improved formula accuracy for quality factor Q of thin film bulk acoustic resonators (FBARs) with close series and parallel resonance frequencies. Traditionally, the series and parallel resonance behaviors are treated independently. The FBAR piezoelectric coupling coefficient is only a few percentages with the series and parallel frequencies close enough to influence each other. The FBARs with two-port configuration are fabricated using silicon bulk micro-machining technology. Including the FBAR transmission lines are analyzed to probe their characteristics using a network analyzer. The signal power loss of the transmission lines is modeled to characterize the FBARs using two-port S parameter measurement data.
  • Keywords
    Q-factor; S-parameters; acoustic resonators; bulk acoustic wave devices; elemental semiconductors; micromachining; micromechanical resonators; piezoelectric devices; silicon; thin film devices; two-port networks; FBAR piezoelectric coupling coefficient; Si; network analyzer; parallel resonance frequency; quality factor; series resonance frequency; signal power loss; silicon bulk micro-machining technology; thin film bulk acoustic resonators; transmission lines; two-port S parameter measurement data; two-port configuration; Couplings; Film bulk acoustic resonators; Piezoelectric films; Power transmission lines; Probes; Q factor; Resonance; Resonant frequency; Silicon; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2007. ISAF 2007. Sixteenth IEEE International Symposium on
  • Conference_Location
    Nara
  • ISSN
    1099-4734
  • Print_ISBN
    978-1-4244-1334-8
  • Electronic_ISBN
    1099-4734
  • Type

    conf

  • DOI
    10.1109/ISAF.2007.4393393
  • Filename
    4393393