Metrological characterizations of wideband digitizers

This paper deals with the characterization of the metrological performance of digitizers so that they can be used for metrology applications. Apart from dc behaviour such as linearity, stability, and noise, especially the dynamic performance of the digitizers is important and thus the measurement of AC flatness, phase, and sample jitter are essential. We present here first results of characterizations of precision sampling voltmeter when DC signals are digitized, with respect of some parameters such as aperture time, "dead" time and autozero.