Title :
Metrological characterizations of wideband digitizers
Author :
Espel, P. ; Bounouh, A. ; Poletaeff, A.
Author_Institution :
LNE, Trappes
Abstract :
This paper deals with the characterization of the metrological performance of digitizers so that they can be used for metrology applications. Apart from dc behaviour such as linearity, stability, and noise, especially the dynamic performance of the digitizers is important and thus the measurement of AC flatness, phase, and sample jitter are essential. We present here first results of characterizations of precision sampling voltmeter when DC signals are digitized, with respect of some parameters such as aperture time, "dead" time and autozero.
Keywords :
analogue-digital conversion; jitter; phase measurement; voltage measurement; voltmeters; AC flatness measurement; DC signals; dynamic performance; jitter measurement; metrological characterization; phase measurement; precision sampling voltmeter; wideband digitizer; Jitter; Linearity; Metrology; Noise measurement; Phase measurement; Phase noise; Sampling methods; Stability; Voltmeters; Wideband;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
DOI :
10.1109/CPEM.2008.4574817
