• DocumentCode
    2279148
  • Title

    Characterization of loading effects in precision 1 Ω resistors

  • Author

    Jones, G.R. ; Elmquist, R.E.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD
  • fYear
    2008
  • fDate
    8-13 June 2008
  • Firstpage
    392
  • Lastpage
    393
  • Abstract
    Precision standard resistors manufactured within the last two decades using improved construction techniques and materials, such as the resistance alloy Evanohm, have been shown to have excellent environmental characteristics. Power dissipation (or loading) effects in several types of resistors have been examined including specifically those made of Manganin and Evanohm, and with the resistor element both sealed within a double wall container, or unsealed. Our recent tests on these resistors demonstrate that conditions of power dissipation within the resistors and the duty cycle of the power applied to the resistor have significant effect on the uncertainty of the measurement.
  • Keywords
    measurement uncertainty; power measurement; resistors; double wall container; measurement uncertainty; power dissipation effects; power loading; precision standard resistors; resistance alloy Evanohm; resistor element; Current measurement; Electrical resistance measurement; Manufacturing; NIST; Power dissipation; Power measurement; Resistors; Temperature; Testing; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
  • Conference_Location
    Broomfield, CO
  • Print_ISBN
    978-1-4244-2399-6
  • Electronic_ISBN
    978-1-4244-2400-9
  • Type

    conf

  • DOI
    10.1109/CPEM.2008.4574818
  • Filename
    4574818