Title :
Leaky-wave phenomena and their unfavorable effect in millimeter-wave circuit devices
Author :
Shigesawa, Hiroshi ; Tsuji, Mikio
Author_Institution :
Dept. of Electron., Doshisha Univ., Kyoto, Japan
Abstract :
It is now known that printed-circuit transmission lines used in millimeter-wave devices can exhibit power-leakage effect. This leakage effect occurs in two different types of the wavenumber behavior even on uniform length of printed-circuit transmission lines. Such wavenumber behaviors yield the unexpected limit of the usable frequency only for the bound-dominant-mode operation and also this limit frequency changes significantly depending on the structural dimensions of a line cross section. Therefore, this paper gives a good grasp of the behavior of the limit frequency which is extremely important for high-performance millimeter-wave device design
Keywords :
coplanar waveguides; crosstalk; integrated circuit packaging; losses; millimetre wave integrated circuits; slot lines; bound-dominant-mode operation; leaky-wave phenomena; limit frequency; line cross section; millimeter-wave circuit devices; power-leakage effect; printed-circuit transmission lines; structural dimensions; uniform length; usable frequency; wavenumber behavior; Coplanar transmission lines; Coplanar waveguides; Distributed parameter circuits; Frequency; Microwave devices; Millimeter wave circuits; Millimeter wave devices; Millimeter wave integrated circuits; Power transmission lines; Strips;
Conference_Titel :
Microwave Conference, 2001. APMC 2001. 2001 Asia-Pacific
Conference_Location :
Taipei
Print_ISBN :
0-7803-7138-0
DOI :
10.1109/APMC.2001.985587
