مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2279582

Title :

Author index

fYear :

1995

fDate :

April 30 1995-May 3 1995

Firstpage :

492

Abstract :

The author index contains an entry for each author and coauthor included in the proceedings record.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

VLSI Test Symposium, 1995. Proceedings., 13th IEEE

Conference_Location :

Princeton, NJ, USA

ISSN :

1093-0167

Print_ISBN :

0-8186-7000-2

Type :

conf

DOI :

10.1109/VTEST.1995.512679

Filename :

512679

Link To Document :