DocumentCode
2279582
Title
Author index
fYear
1995
fDate
April 30 1995-May 3 1995
Firstpage
492
Abstract
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1995. Proceedings., 13th IEEE
Conference_Location
Princeton, NJ, USA
ISSN
1093-0167
Print_ISBN
0-8186-7000-2
Type
conf
DOI
10.1109/VTEST.1995.512679
Filename
512679
Link To Document