• DocumentCode
    2279657
  • Title

    Modeling and characterization of the bonding-wire interconnection for microwave MCM

  • Author

    Ying, Liang ; Chunyue, Huang ; Wangang, Wang

  • Author_Institution
    Dept. of Electron. Eng., Chengdu Aeronaut. Vocational & Tech. Coll., Chengdu, China
  • fYear
    2010
  • fDate
    16-19 Aug. 2010
  • Firstpage
    810
  • Lastpage
    814
  • Abstract
    The 3-D electromagnetic software Ansoft HFSS is adapted to modeling analysis and simulation optimization about the microwave characteristics of bonding interconnection in the MMCM. The gold bond model contained micro strip is set up to emulate and optimize for insertion loss (IL) and return loss (RL), according to the major parameters such as arch highness, span and the root of the number of gold. Micro strip model of three roots copper wire connection is established to analyses the difference between microwave characteristics of the golden and copper. The results showed that arch highness of bonding gold wire is the lower the better in the case of singles gold and the same span. The span of bonding gold wire is the shorter the better in the case of singles gold and the same arch highness. It should be as far as possible bond 2 or 3 roots gold if the chip welding area allowed. Copper wire has shown better microwave properties than gold in the area of return loss and insertion loss.
  • Keywords
    computational electromagnetics; copper; electronic engineering computing; gold; integrated circuit interconnections; microwave integrated circuits; multichip modules; 3D electromagnetic software; Ansoft HFSS; bonding interconnection; bonding-wire interconnection; copper wire connection; gold bond model; insertion loss; micro strip model; microwave MCM; microwave characteristics; modeling analysis; return loss; simulation optimization; Analytical models; Bonding; Gold; Integrated circuit interconnections; Microwave circuits; Microwave filters; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-8140-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2010.5582690
  • Filename
    5582690