DocumentCode
2279657
Title
Modeling and characterization of the bonding-wire interconnection for microwave MCM
Author
Ying, Liang ; Chunyue, Huang ; Wangang, Wang
Author_Institution
Dept. of Electron. Eng., Chengdu Aeronaut. Vocational & Tech. Coll., Chengdu, China
fYear
2010
fDate
16-19 Aug. 2010
Firstpage
810
Lastpage
814
Abstract
The 3-D electromagnetic software Ansoft HFSS is adapted to modeling analysis and simulation optimization about the microwave characteristics of bonding interconnection in the MMCM. The gold bond model contained micro strip is set up to emulate and optimize for insertion loss (IL) and return loss (RL), according to the major parameters such as arch highness, span and the root of the number of gold. Micro strip model of three roots copper wire connection is established to analyses the difference between microwave characteristics of the golden and copper. The results showed that arch highness of bonding gold wire is the lower the better in the case of singles gold and the same span. The span of bonding gold wire is the shorter the better in the case of singles gold and the same arch highness. It should be as far as possible bond 2 or 3 roots gold if the chip welding area allowed. Copper wire has shown better microwave properties than gold in the area of return loss and insertion loss.
Keywords
computational electromagnetics; copper; electronic engineering computing; gold; integrated circuit interconnections; microwave integrated circuits; multichip modules; 3D electromagnetic software; Ansoft HFSS; bonding interconnection; bonding-wire interconnection; copper wire connection; gold bond model; insertion loss; micro strip model; microwave MCM; microwave characteristics; modeling analysis; return loss; simulation optimization; Analytical models; Bonding; Gold; Integrated circuit interconnections; Microwave circuits; Microwave filters; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4244-8140-8
Type
conf
DOI
10.1109/ICEPT.2010.5582690
Filename
5582690
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