DocumentCode
2279726
Title
Impact of hygroswelling and vapor pressure on delamination
Author
Zhao, Shufeng ; Chen, Xu ; Yao, Jinzhong
Author_Institution
Freescale Semicond. Inc., Tianjin
fYear
2006
fDate
6-8 Dec. 2006
Firstpage
773
Lastpage
780
Abstract
In this paper, resolving methods for several key issues in simulation of interface delamination of plastic package under temperature and humidity environment are discussed. Structural model of plastic package under temperature and humidity is constructed, and the coupling of the thermal and moisture impact on structure field is implemented. The method of determining the vapor pressure in crack during process of solder reflow is presented. The precondition processes of moisture absorption and solder reflow of a real package are simulated, and the results of finite element model are analyzed with mixed mode fracture and interface cracking.
Keywords
delamination; finite element analysis; fracture; plastic packaging; reflow soldering; surface cracks; swelling; vapour pressure; finite element model; hygroswelling; interface cracking; interface delamination; mixed mode fracture cracking; moisture absorption; moisture impact; plastic packaging; solder reflow; vapor pressure; Absorption; Delamination; Electronic packaging thermal management; Finite element methods; Heat transfer; Humidity; Moisture; Plastic packaging; Semiconductor device modeling; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference, 2006. EPTC '06. 8th
Conference_Location
Singapore
Print_ISBN
1-4244-0664-1
Electronic_ISBN
1-4244-0665-X
Type
conf
DOI
10.1109/EPTC.2006.342810
Filename
4147339
Link To Document