• DocumentCode
    2279726
  • Title

    Impact of hygroswelling and vapor pressure on delamination

  • Author

    Zhao, Shufeng ; Chen, Xu ; Yao, Jinzhong

  • Author_Institution
    Freescale Semicond. Inc., Tianjin
  • fYear
    2006
  • fDate
    6-8 Dec. 2006
  • Firstpage
    773
  • Lastpage
    780
  • Abstract
    In this paper, resolving methods for several key issues in simulation of interface delamination of plastic package under temperature and humidity environment are discussed. Structural model of plastic package under temperature and humidity is constructed, and the coupling of the thermal and moisture impact on structure field is implemented. The method of determining the vapor pressure in crack during process of solder reflow is presented. The precondition processes of moisture absorption and solder reflow of a real package are simulated, and the results of finite element model are analyzed with mixed mode fracture and interface cracking.
  • Keywords
    delamination; finite element analysis; fracture; plastic packaging; reflow soldering; surface cracks; swelling; vapour pressure; finite element model; hygroswelling; interface cracking; interface delamination; mixed mode fracture cracking; moisture absorption; moisture impact; plastic packaging; solder reflow; vapor pressure; Absorption; Delamination; Electronic packaging thermal management; Finite element methods; Heat transfer; Humidity; Moisture; Plastic packaging; Semiconductor device modeling; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2006. EPTC '06. 8th
  • Conference_Location
    Singapore
  • Print_ISBN
    1-4244-0664-1
  • Electronic_ISBN
    1-4244-0665-X
  • Type

    conf

  • DOI
    10.1109/EPTC.2006.342810
  • Filename
    4147339