DocumentCode :
2279849
Title :
On the thermal characterization of an exposed top quad flat no-lead package
Author :
Ma, Y.Y. ; Krishnamoorthi, S. ; Wang, C.K. ; Sun, Anthony Y S ; Zhu, W.H. ; Tan, H.B.
Author_Institution :
Packaging Anal. & Design Center, United Test & Assembly Center Ltd., Singapore
fYear :
2006
fDate :
6-8 Dec. 2006
Firstpage :
810
Lastpage :
814
Abstract :
The relentless trend of ever increasing integrated circuit chip functionality and decreasing chip dimensions for miniaturization of products have led to intense heat dissipation in IC chips. The problem of effective cooling of chips at an acceptable cost is now becoming an urgent issue (Guenin, 1997). Leadframe CSP package is a promising candidate for portable wireless applications such as Bluetooth and home RF. It offers attractive attributes in terms of a near CSP footprint, good electrical and thermal characteristics. This paper addresses the concern and possible solution when conducting thermal characterization of an exposed top quad flat no-lead (et-QFN) package, which had successfully been developed and qualified in United Test and Assembly Center (UTAC). Studies were performed to assess the impact of JEDEC test board types, with/without metal housing under different air speeds using commercial CFD code and the same is validated with experiment results. FA tools were used to pinpoint factors that are to blame for the significant measurement errors observed. Good agreement could be achieved between simulation and testing results when these factors were included into the CFD models. Recommendations regarding SMT and modification of specifications of 2s2p JESD51 PCB are proposed and discussed.
Keywords :
surface mount technology; thermal management (packaging); CFD modeling; CFD simulation; IC chips; exposed top quad flat no-lead package; heat dissipation; leadframe CSP package; thermal characterization; thermal measurement; thermal resistance; thermal validation; Assembly; Bluetooth; Chip scale packaging; Computational fluid dynamics; Cooling; Costs; Integrated circuit packaging; Radio frequency; Testing; Thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 2006. EPTC '06. 8th
Conference_Location :
Singapore
Print_ISBN :
1-4244-0664-1
Electronic_ISBN :
1-4244-0665-X
Type :
conf
DOI :
10.1109/EPTC.2006.342816
Filename :
4147345
Link To Document :
بازگشت