Title :
RF measurements of nanoscale devices: Challenges and opportunities
Author :
Burke, P.J. ; Rutherglen, C.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Irvine, CA, USA
Abstract :
This invited talk will describe some of the opportunities and challenges associated with RF measurements of nanoelectronic devices.
Keywords :
carbon nanotubes; nanoelectronics; nanotube devices; radiofrequency measurement; C; RF measurements; carbon nanotube; challenges; nanoelectronic devices; nanoscale devices; opportunities; Electric fields; Electric variables measurement; Electron emission; Electron optics; Frequency measurement; Impedance; Nanoscale devices; Optical saturation; Radio frequency; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
DOI :
10.1109/CPEM.2008.4574869
