Title :
Uncertainty analysis for noise-parameter measurements
Author_Institution :
Electromagn. Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
A brief summary is presented for the uncertainty analysis for measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of the noise correlation matrix, and the traditional IEEE noise parameters.
Keywords :
amplifiers; electric noise measurement; measurement uncertainty; transistors; X-parameters; amplifiers; coaxial environments; connectorized environments; noise correlation matrix; noise-parameter measurements; on-wafer environments; traditional IEEE noise parameters; transistors; uncertainty analysis; Acoustic reflection; Coaxial components; Computational modeling; Distributed computing; NIST; Noise measurement; Performance evaluation; Scattering parameters; Temperature measurement; Working environment noise;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
DOI :
10.1109/CPEM.2008.4574871
