• DocumentCode
    2280123
  • Title

    Magnetic permeability, losses and ferromagnetic resonance in ferrites under magnetic field bias from DC to the microwave regime

  • Author

    Pasquale, M. ; Fiorillo, F. ; Coisson, M. ; Beatrice, C.

  • Author_Institution
    Divisione Elettromagnetismo, Ist. Naz. di Ricerca Metrologica INRIM, Turin
  • fYear
    2008
  • fDate
    8-13 June 2008
  • Firstpage
    524
  • Lastpage
    525
  • Abstract
    Fluxmetric and transmission line methods have been combined to achieve accurate determination of energy loss and complex permeability in soft ferrites from DC to microwave frequencies. Superposition of the results in the MHz frequency range proves instrumental to obtain reproducible data and traceability to the appropriate standards. Permeability curves are strongly affected by ferromagnetic resonance, which can be frequency shifted using a bias field applied transverse to the AC exciting field. The permeability behavior can be correctly predicted by physical modeling, allowing one to separate domain wall and rotational processes, respectively associated with pure relaxation effects and bias field dependent damped resonant behavior.
  • Keywords
    ferrites; ferromagnetic resonance; magnetic domain walls; magnetic leakage; magnetic permeability; magnetic relaxation; manganese compounds; zinc compounds; MnZnFe3O4; NiZnFe3O4; bias field dependent damped resonant behavior; domain wall; energy loss; ferrites; ferromagnetic resonance; fluxmetric methods; magnetic field bias; magnetic losses; magnetic permeability; microwave frequencies; relaxation effects; rotational processes; transmission line methods; Energy loss; Ferrites; Instruments; Magnetic fields; Magnetic losses; Magnetic resonance; Microwave frequencies; Permeability; Predictive models; Transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
  • Conference_Location
    Broomfield, CO
  • Print_ISBN
    978-1-4244-2399-6
  • Electronic_ISBN
    978-1-4244-2400-9
  • Type

    conf

  • DOI
    10.1109/CPEM.2008.4574884
  • Filename
    4574884