DocumentCode
228025
Title
Reliability of solid-state lighting electrical drivers subjected to WHTOL accelerated aging
Author
Lall, P. ; Sakalaukus, Peter ; Davis, Lisa
Author_Institution
NSF-CAVE3 Electron. Res. Center, Auburn Univ., Auburn, AL, USA
fYear
2014
fDate
27-30 May 2014
Firstpage
1164
Lastpage
1170
Abstract
An investigation of a solid-state lighting (SSL) luminaire with the focus on the electronic driver which has been exposed to a standard wet hot temperature operating life (WHTOL) of 85% RH and 85°C in order to assess reliability of prolonged exposer to a harsh environment has been conducted. SSL luminaires are beginning introduced as headlamps in some of today´s luxury automobiles and may also be fulfilling a variety of important outdoor applications such as overhead street lamps, traffic signals and landscape lighting. SSL luminaires in these environments are almost certain to encounter excessive moisture from humidity and high temperatures for a persistent period of time. The lack of accelerated test methods for LEDs to assess long-term reliability prior to introduction into the marketplace, a need for SSL physics based PHM modeling indicators for assessment and prediction of LED life, as well as the U.S. Department of Energy´s R&D roadmap to replace todays lighting with SSL luminaires makes it important to increase the understanding of the reliability of SSL devices, specifically, in harsh environment applications. In this work, a set of SSL electrical drivers were investigated to determine failure mechanisms that occur during prolonged harsh environment applications. Each driver consists of four aluminum electrolytic capacitors (AECs) of three different types and was considered the weakest component inside the SSL electrical driver. The reliability of the electrical driver was assessed by monitoring the change in capacitance and the change in equivalent series resistance for each AEC, as well as monitoring the luminous flux of the SSL luminaire or the output of the electrical driver. The luminous flux of a pristine SSL electrical driver was also monitored in order to detect minute changes in the electrical drivers output and to aid in the investigation of the SSL luminaires reliability. The failure mechanisms of the electrical drivers have been d- termined and are presented in this paper.
Keywords
LED lamps; driver circuits; electrolytic capacitors; failure analysis; lighting; reliability; AEC; LED life assessment; LED life prediction; SSL luminaires; SSL physics based PHM modeling indicators; WHTOL accelerated aging; aluminum electrolytic capacitors; electronic driver; failure mechanisms; landscape lighting; overhead street lamps; solid-state lighting electrical driver reliability; solid-state lighting luminaire; traffic signals; wet hot temperature operating life; Abstracts; Capacitors; Driver circuits; Light emitting diodes; Reliability; Solid modeling; Electrolytic Capacitor; LED; Solid-State Lighting;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2014 IEEE Intersociety Conference on
Conference_Location
Orlando, FL
ISSN
1087-9870
Type
conf
DOI
10.1109/ITHERM.2014.6892411
Filename
6892411
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