DocumentCode
2280470
Title
Wavelet-based differential nonlinearity testing of mixed signal system ADCs
Author
Akujuobi, Cajetan M. ; Awada, Emad ; Sadiku, Matthew ; Ali, Warsame
Author_Institution
Center of Excellence for Commun. Syst. Technol. Res., A & M Univ., Prairie View, TX
fYear
2007
fDate
22-25 March 2007
Firstpage
76
Lastpage
81
Abstract
This paper discusses the work done in the testing and measurement of differential nonlinearity (DNL) of analog- to-digital converters (ADCs) by applying a novel testing technique of wavelet transform. The results of the new method are compared with conventional testing methods. The wavelet transform technique shows significant advantage over the conventional techniques.
Keywords
analogue-digital conversion; automatic testing; integrated circuit testing; mixed analogue-digital integrated circuits; wavelet transforms; analog- to-digital converters; mixed signal system ADC; wavelet transform; wavelet-based differential nonlinearity testing; Additive noise; Communications technology; Fast Fourier transforms; Histograms; Quantization; Senior members; Signal processing; System testing; Voltage; Wavelet transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
SoutheastCon, 2007. Proceedings. IEEE
Conference_Location
Richmond, VA
Print_ISBN
1-4244-1028-2
Electronic_ISBN
1-4244-1029-0
Type
conf
DOI
10.1109/SECON.2007.342859
Filename
4147389
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