DocumentCode :
2280711
Title :
Fatigue fracture mechanisms of Cu/lead-free solders interfaces
Author :
Zhang, Q.K. ; Zhu, Q.S. ; Zhang, Z.F.
Author_Institution :
Shenyang Nat. Lab. for Mater. Sci., Chinese Acad. of Sci., Shenyang, China
fYear :
2010
fDate :
16-19 Aug. 2010
Firstpage :
1168
Lastpage :
1173
Abstract :
The fatigue fracture behaviors of a series of Cu/lead-free solder joints deformed under different directions of loadings were investigated in this study. Observation results showed that fatigue cracks generally initiate around the IMC/solder interface when the loading axis is vertical to the interface. For all the solder joints, the interfacial deformations are resulting from strain localization induced by the stain mismatch. Fracture surface observations reveal that the crack propagation path and fatigue resistance of the solder joints are affected by the yield strength and mechanical property of the solder. When the copper/solder interface is parallel to the loading axis, the interfacial IMC layer failed approximately perpendicular to the interface under the action of slip bands, and then the cracks propagated to the IMC/solder interface, leading to the fracture along the interface.
Keywords :
fatigue cracks; solders; IMC-solder interface; copper-lead-free solder interfaces; crack propagation path; fatigue cracks; fatigue fracture mechanisms; fatigue resistance; fracture surface observations; interfacial IMC layer; interfacial deformations; mechanical property; solder joints; stain mismatch; strain localization; yield strength; Aging; Copper; Fatigue; Loading; Soldering; Strain; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-8140-8
Type :
conf
DOI :
10.1109/ICEPT.2010.5582753
Filename :
5582753
Link To Document :
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