• DocumentCode
    2280711
  • Title

    Fatigue fracture mechanisms of Cu/lead-free solders interfaces

  • Author

    Zhang, Q.K. ; Zhu, Q.S. ; Zhang, Z.F.

  • Author_Institution
    Shenyang Nat. Lab. for Mater. Sci., Chinese Acad. of Sci., Shenyang, China
  • fYear
    2010
  • fDate
    16-19 Aug. 2010
  • Firstpage
    1168
  • Lastpage
    1173
  • Abstract
    The fatigue fracture behaviors of a series of Cu/lead-free solder joints deformed under different directions of loadings were investigated in this study. Observation results showed that fatigue cracks generally initiate around the IMC/solder interface when the loading axis is vertical to the interface. For all the solder joints, the interfacial deformations are resulting from strain localization induced by the stain mismatch. Fracture surface observations reveal that the crack propagation path and fatigue resistance of the solder joints are affected by the yield strength and mechanical property of the solder. When the copper/solder interface is parallel to the loading axis, the interfacial IMC layer failed approximately perpendicular to the interface under the action of slip bands, and then the cracks propagated to the IMC/solder interface, leading to the fracture along the interface.
  • Keywords
    fatigue cracks; solders; IMC-solder interface; copper-lead-free solder interfaces; crack propagation path; fatigue cracks; fatigue fracture mechanisms; fatigue resistance; fracture surface observations; interfacial IMC layer; interfacial deformations; mechanical property; solder joints; stain mismatch; strain localization; yield strength; Aging; Copper; Fatigue; Loading; Soldering; Strain; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-8140-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2010.5582753
  • Filename
    5582753