Title :
A synchronous sampling system for high precision AC measurements
Author :
Overney, F. ; Jeanneret, B. ; Mortara, A.
Author_Institution :
Fed. Office of Metrol. METAS, Bern
Abstract :
This paper describes a synchronous sampling system which is based on commercial high accuracy I/O devices. The advantage of such devices is their native synchronization capabilities which greatly simplify the timing of the measurements. The type A uncertainty of the system is around 0.3-10-6 in a 2 minutes measurement time, showing that this system is suitable for a large variety of precision impedance measurements.
Keywords :
computerised instrumentation; electric impedance measurement; measurement standards; measurement uncertainty; synchronisation; commercial high accuracy I/O device; high precision AC measurement; native synchronization; precision impedance measurement; synchronous sampling system; time 2 min; uncertainty measurement; Calibration; Clocks; Frequency synchronization; Hardware; Impedance measurement; Metrology; Multiplexing; Sampling methods; System testing; Timing;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
DOI :
10.1109/CPEM.2008.4574920
