Title :
Evaluation of uncertainty in AC voltage measurement using a digital voltmeter and Swerlein´s algorithm
Author :
Kyriazis, G.A. ; Swerlein, R.
Author_Institution :
Instituto Nacional de Metrologia, Rio de Janeiro, Brazil
Abstract :
A model is proposed for a sampling algorithm that uses a high-resolution voltmeter for measuring the RMS value of a sinusoidal voltage waveform. The uncertainty associated with the result of measurement is evaluated according to the rules in the ISO/BIPM guide to the expression of uncertainty in measurement. The standard uncertainty was evaluated to be less than 5/spl times/10/sup -6/ in the 1-1000 V and 1-100 Hz ranges. The uncertainty contribution associated with the conditioner and amplifier frequency response correction is dominant in the high frequency range.
Keywords :
ISO standards; amplifiers; analogue-digital conversion; digital voltmeters; frequency response; measurement uncertainty; signal sampling; voltage measurement; 1 to 100 Hz; 1 to 1000 V; AC voltage measurement; ADC; ISO standards; Swerlein´s algorithm; amplifier frequency response correction; high-resolution digital voltmeters; measurement frequency range; measurement uncertainty evaluation; measurement voltage range; sampling algorithms; signal conditioners; sinusoidal voltage waveform RMS value; Apertures; Frequency conversion; Frequency measurement; Frequency response; Measurement uncertainty; Random processes; Sampling methods; Testing; Voltage measurement; Voltmeters;
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
DOI :
10.1109/CPEM.2002.1034701
