DocumentCode :
2281184
Title :
Wavelet-based measurement and classification of power quality disturbances
Author :
Chen Xiangxun
Author_Institution :
Electr. Power Res. Inst., Beijing, China
fYear :
2002
fDate :
16-21 June 2002
Firstpage :
38
Lastpage :
39
Abstract :
This paper introduces a wavelet-based method for detecting, localizing, quantifying and classifying short duration power quality disturbances. It can take the fast dyadic scheme not the time consuming shift-invariant scheme. Novel binary features are defined and extracted from time or WT domain, and then a simple binary-decimal conversion is sufficient for classification purpose. This benefits the method in both speed and accuracy.
Keywords :
harmonics; power supply quality; wavelet transforms; SDPQDs; binary-decimal conversion; classification; fast dyadic scheme; power quality disturbances; shift-invariant scheme; wavelet-based measurement; Electric variables measurement; Event detection; Frequency; Harmonic analysis; Harmonic distortion; Power harmonic filters; Power measurement; Power quality; Signal analysis; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
Type :
conf
DOI :
10.1109/CPEM.2002.1034708
Filename :
1034708
Link To Document :
بازگشت