DocumentCode :
2281263
Title :
Gapless rework and reliability of lead-free BGA assemblies
Author :
Lee, Yong-Won ; Hong, Soon-Min ; Moon, Young-Joon
Author_Institution :
Manuf. Technol. Center, Samsung Electron. Co., Ltd., Suwon, South Korea
fYear :
2010
fDate :
16-19 Aug. 2010
Firstpage :
1259
Lastpage :
1264
Abstract :
In lead-free rework, it is almost impossible not to affect other adjacent parts when applying an existing hot-gas rework to the removal/exchange of parts as they are packed together. The fine pitch BGA components might be heat-damaged by the hot-gas or distorted, while smaller, passive components might experience a distortion of the parts due to melting of soldered joints. In such cases, it would be difficult to guarantee the reliability of the parts. This study focuses on reworked BGA components using flux-only application method. It is important to note that this study did not rework the initial BGA components to evaluate their reliability. As the results indicate, the reworked BGA components show an approximate 36% reduction in life expectancy over the non-reworked BGA components. The adjacent BGA component was also degraded in the drop shock test after the rework process was completed. This adjacent BGA component showed an approximate 38% reduction in drop reliability.
Keywords :
ball grid arrays; integrated circuit reliability; solders; ball grid arrays; drop reliability; flux-only application method; gapless rework; hot-gas rework; lead-free BGA assemblies; lead-free rework; soldered joints melting; Joints; Lead; Reliability; Soldering; Testing; Weibull distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-8140-8
Type :
conf
DOI :
10.1109/ICEPT.2010.5582782
Filename :
5582782
Link To Document :
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