• DocumentCode
    2281268
  • Title

    A new model for electrical ageing and breakdown in dielectrics

  • Author

    Lewis, T.J. ; Llewellyn, J.P. ; van der Sluijs, M.J. ; Freestone, J. ; Hampton, R.N.

  • Author_Institution
    Univ. of Wales, Bangor, UK
  • fYear
    1996
  • fDate
    23-26 Sep 1996
  • Firstpage
    220
  • Lastpage
    224
  • Abstract
    We derive a simple but generally applicable model for multi-factor ageing in which thermally-induced bond scission is a universal underlying physical process which determines ageing. The final destruction of the dielectric is assumed to occur by a Griffith-crack treeing process and this will have a formative time which will be part of the overall ageing time. Whether it will be a significant part will depend on tc and therefore on the field E
  • Keywords
    electric breakdown; Griffith crack; breakdown; dielectric; model; multi-factor electrical ageing; thermally-induced bond scission; treeing;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Dielectric Materials, Measurements and Applications, Seventh International Conference on (Conf. Publ. No. 430)
  • Conference_Location
    Bath
  • ISSN
    0537-9989
  • Print_ISBN
    0-85296-670-9
  • Type

    conf

  • DOI
    10.1049/cp:19961026
  • Filename
    607386
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2281268