• DocumentCode
    2281306
  • Title

    Gamma degradation of light-emitting diodes based on heterostructures AlGaInP

  • Author

    Orlova, K.N. ; Gradoboev, A.V. ; Asanov, I.A.

  • Author_Institution
    Yurga Institute of Technology, Tomsk Polytechnic University, Yurga Russian Federation
  • fYear
    2012
  • fDate
    18-21 Sept. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Gamma degradation was investigated for AlGaInP light-emitting diodes with wavelengths in the 590 nm region. The process of degradation light output power is shown in two stages. Light-current and current-voltage characteristic of the light-emitting diodes fabricated on the basis of heterostructures with AlGaInP multiple quantum wells has possible to distinguished areas of weak and strong injection of electrons into the active region of the diodes by measuring light output. The value of the light output power of LEDs irradiated 60Co gamma-rays in a passive mode decreases with increasing radiation dose, while power of degradation of light output is directly proportional to dose and fluency and is inversely proportional to the operating current at which it measured. With reduction of radiation dose differences between the region of strong injection and weak injection increases. Comparison of the research results made of different semiconductor structures suggests that the stages of degradation processes is common to all light-emitting diodes under irradiation by fast neutrons, protons, electrons and gamma rays.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; gamma-ray effects; indium compounds; light emitting diodes; quantum well devices; semiconductor heterojunctions; semiconductor quantum wells; 60Co gamma-rays; AlGaInP; LED light output power measurement; current-voltage characteristic; diodes active region; electron injection; electrons irradiation; fast neutrons irradiation; gamma degradation; gamma rays irradiation; heterostructures-based light-emitting diode fabrication; light output power degradation; light-current characteristic; multiple quantum wells; passive mode; protons irradiation; radiation dose reduction; semiconductor structures; strong injection region; wavelength 590 nm; weak injection region; Degradation; Light emitting diodes; Power generation; Radiation effects; Radiative recombination; Semiconductor device measurement; Semiconductor diodes; AlGaInP heterostructures; light-emitting diodes with quantum wells; radiation sensitivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Strategic Technology (IFOST), 2012 7th International Forum on
  • Conference_Location
    Tomsk
  • Print_ISBN
    978-1-4673-1772-6
  • Type

    conf

  • DOI
    10.1109/IFOST.2012.6357528
  • Filename
    6357528