• DocumentCode
    2281435
  • Title

    Power Supply Noise Analysis in DSM Circuits

  • Author

    Jianchun, He ; Lixin, Jia ; Sheng, Liu

  • Author_Institution
    Zhejiang Univ. of Technol., Hangzhou
  • fYear
    2007
  • fDate
    16-17 Aug. 2007
  • Firstpage
    1416
  • Lastpage
    1419
  • Abstract
    The continuous technology advance into the VDSM regime has brought the noise and signal integrity issues into the spotlight. It seems to be more important to estimate the power supply noise efficiently and accurately than other design metrics such as area, timing and power. At the same time, the capacitive and inductive effect should no longer be ignored in the noise analysis process. In the work, a GA-based statistical modeling technique is presented to find the worst-case time-domain voltage variation in VLSI power distribution network including inductive and resistive effects. And, the statistical power supply noise is also mapped into perturbation of the macroblock delay. Experimental results are put together with SPICE simulations, and show the validity of the method.
  • Keywords
    VLSI; circuit noise; genetic algorithms; power supply circuits; statistical analysis; DSM circuits; GA-based statistical modeling technique; VDSM; VLSI power distribution network; capacitive effect; inductive effect; noise integrity; power supply noise analysis; signal integrity; time-domain voltage variation; Circuit analysis; Circuit noise; Delay; Power supplies; Power systems; SPICE; Time domain analysis; Timing; Very large scale integration; Voltage; genetic algorithm; parasitic effect; power supply noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications, 2007 International Symposium on
  • Conference_Location
    Hangzhou
  • Print_ISBN
    978-1-4244-1045-3
  • Electronic_ISBN
    978-1-4244-1045-3
  • Type

    conf

  • DOI
    10.1109/MAPE.2007.4393544
  • Filename
    4393544